FEI Nova NanoSEM 630 Scanning Electron Microscope
Instrument/ServiceType:
Scanning Electron Microscope
Make/ Model:
FEI Nova NanoSEM 630
Instrument Description:
Performs electron microscopy. It can also be used to do electron beam lithography.
Keywords for the Instrument:
Mireau Interferometer, Image Capture, 3-Axis-Automated Stage
Instrument Website URL:
http://jila-kecklab.colorado.edu/
Primary Contact Name:
Scot Bohnenstiehl
Email: kecklab@jila.colorado.edu
Phone 303.492.2389
Home Department/Institute:
JILA
Home Facility:
JILA Keck Lab
Instrument Location:
JILA X131A
Instrument Availability to Campus Users:
Open on a case-by-case basis to the university users outside of the home department
Instrument Availability to External Academic and National Lab Users:
Open on a case-by-case basis to academic and national lab users