Instrument/ServiceType:
Contact and Tapping Mode AFM
Make/ Model:
Bruker/Digital Instruments DI 3100
Instrument Description:
Instrument Description: A scanning probe microscope typically used for surface characterization and height measurements at the angstrom level.
Instrument Website URL:
http://jila-kecklab.colorado.edu/
Primary Contact:
David Alchenberger
email: alchenbd@jila.colorado.edu
Phone: 303.492.2389
Home Department/Institute:
JILA
Home Facility:
JILA Keck Lab
Instrument Location:
JILA S105