Dr. Marla Dowell is the Director of the CHIPS Metrology Program and NIST Boulder Laboratory. She began her career at NIST as a researcher in the field of optical metrology for photolithography. Dowell has represented NIST on national and international standards committees as well as external advisory committees on research innovation, photonics, and communications.
Dr. Dowell has a passion for solving problems that help people. Her work has touched the lives of many by enabling better optical measurements for photodynamic therapy to treat cancer, laser safety, communications, and manufacturing. Her abilities to foster collaborations with both private and public sector partners and to lead high performing research organizations have been recognized with numerous awards, including the Allen V. Astin Award, the Arthur S. Flemming Award from George Washington University, and the Presidential Rank Award as a Distinguished Executive. Dowell is a fellow of SPIE, senior member of IEEE, and a member of the Federal Innovation Council.