Benjamin Shear

For this report, we analyzed longitudinal administrative data collected by the Colorado Department of Education to track the academic performance of schools. The analyses contained in this report focus on the set of schools receiving School Turnaround Network (STN) and School Turnaround Leadership Development (STLD) supports.

This report focuses on one particular technical choice CDE must make when deciding which version of the SGP model to use in measuring student growth, namely whether these measures should be based on so-called cohort or baseline-referenced SGPs.

Link to Resource: Between-Year Stability of Growth Percentiles : Technical Brief #3Authors: Benjamin R. Shear and Elena Diaz-BilelloThe purpose of this research brief for the Colorado Department of Education

Link to Resource: Growth Percentiles, Achievement & Demographics: Technical Brief #1 - 2019Author: Benjamin R. Shear and Elena Diaz-BilelloThe purpose of this research brief for the Colorado Department of

Link to Resource: Factors Impacting Growth Percentile Variability: Technical Brief #2 - 2019Author: Benjamin R. Shear and Elena Diaz-BilelloThe purpose of this research brief for the Colorado Department of

Link to Resource: Summary of Median Growth Percentile Analyses: Descriptive Statistics, Demographics Correlations, and Stability AnalysesAuthors: Benjamin R. ShearCitation: Shear, B.R. (2019). Summary of median growth percentile analyses:

Keynote address presented by Benjamin Shear at the St John’s University in Queens, New York at the 7th Annual Leadership Symposium on Mar. 16, 2019. In this talk Dr. Shear will discuss the Stanford Education Data Archive (SEDA),

By Benjamin Shear. When contextual features of test-taking environments differentially affect item responding for different test-takers and these features vary across test administrations, they may cause differential item functioning (DIF) that varies across test administrations. Because many common DIF detection methods ignore potential DIF variance, this paper proposes the use of random coefficient hierarchical logistic regression (RC-HLR) models to test for both uniform DIF and DIF variance simultaneously.

Link to Resource:  Considerations for Adopting and Implementing Innovative Assessment SystemsAuthors:  Benjamin Shear, Elena Diaz-Bilello, Rajendra ChattergoonSuggested citation:  Shear, B.R., Diaz-Bilello, E., & Chattergoon