Silicon BucklingIn previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin films. Systematic experimental and analytical studies are conducted for buckling of finite-width stiff thin films on compliant substrates. Both experiments and analytical solution show that the buckling amplitude and wavelength increase with the film width.The effect of film spacing is also studied via the analytical solutions for two thin films and for periodic thin films. 

References:

H. Jiang, D.-Y. Khang, H. Fei, H. Kim, Y. Huang, J. Xiao, and J. A. Rogers, Finite Width Effect of Thin-Films Buckling on Compliant Substrate: Experimental and Theoretical Studies. J. Mech. Phys. Solids 56, 2585-2598 (2008).