Samuel Liu

Project Description: 

The associate's work entails making high speed electronic and optical measurements of the Heisenberg exchange parameter on state of the art samples and devices from industrial collaborators. The associate works closely with collaborators to analyze these results and use the results to develop better predictive models of device performance. In addition, the associate involves fabrication of metrological structures using magnetic thin-film deposition tools and photo- and electron-beam lithography to develop metrology for high-speed real-time measurements of high-impedance devices.