Instrument/ServiceType:

Multi-mode AFM

Make/ Model:

Bruker/Digital Instruments MMAFM-2

Instrument Description:

Scanning probe microscope used to characterize surfaces with atomic resolution. Modes include tapping and contact AFM, MFM, and Tunnelling Microscopy.

Instrument Website URL: 

http://jila-kecklab.colorado.edu/

Primary Contact:

David Alchenberger

email: alchenbd@jila.colorado.edu

Phone: 303.492.2389

Home Department/Institute:

JILA

Home Facility:

JILA Keck Lab

Instrument Location:

JILA S105