Physics 3330: Electronics for the Physical Sciences
Professor John Price
The silicon photodiode is often used to measure small motions. In atomic force microscopes (AFMs) a small flexible cantilever with a sharp tip is scanned over a surface. A laser beam is reflected off the back of the cantilever onto a segmented photodiode. By comparing the currents in the photodiode segments, small deflections of the cantilever can be detected. This signal is used to construct an image of the surface topography. The method is so sensitive that often individual atoms on the surface can be resolved. For more about AFMs click here, and for an image gallery look here.
Labs 7 and 8 cover optoelectronics and bipolar transistors. Project proposals are due March 18, so now would be a good time to start thinking about what you are going to do. Click on the link "Past Projects" for some ideas, or Google something that sounds like fun and see what you come up with. Then, bounce your ideas off your instructor.
Home page from week 1-2, 3-4, 5-6.
I welcome your comments on the class and this website. Send them to John Price