Alan C. Gallagher

Lecturer. Ph.D. Columbia University, 1964.

Laser spectroscopy is used to measure atomic and molecular collision processes, including collisional line shapes, inelastic atom-atom collisions, and electron impact processes. The plasma and surface physics and chemistry involved in semiconductor and photovoltaic productions are also studied.
 

Selected Publications

• "Exoergic Collisions of cold Na*-Na," with D. Pritchard, Phys. Rev. Let. 63, 957 (1989).
• "Spatial Distribution of a Si:H Film-Producing Radicals in Silane rf Glow Discharges," with D.A. Doughty, J. Appl. Phys. 67, 139 (1990).
• "Differential Cross Section for Na Fine-Structure Transfer Induced by Na and K Collisions," with P.N. Arcuni and M.L. Troyer, Phys. Rev. A 41, 2398 (1990).
• "Surface Reaction Probability of Film-Producing Radicals in Silane Glow Discharges," J. Appl. Phys., with D.A. Doughty, J.R. Doyle and G.H. Lin, (in press).

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