Material Identification/CHaracterization Equipment
Materials identification is possible through the use of a number of electron microscopes and nanoindentors.
LVSEM (Thermal emission SEM)
LVSEM (JEOL JSM-6480LV): The LVSEM is a thermal emission SEM with a unique low vacuum mode (LV) that allows for observation of specimens that are difficult to view due to excessive surface charging. Typical magnification in this SEM can be up to one hundred thousand times, however higher magnification can be obtained by a skilled operator. This microscope excels at imaging biological, polymer, and other non-conductive specimens. It can also handle specimens exhibiting continued out gassing of volatiles that is usually not permissible in standard SEMs. Also installed on this microscope is an energy dispersive X-ray spectrometer (EDS), to perform composition (elemental) analysis on most samples even in the LV mode.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org
FESEM (high resolution SEM)
FESEM (JEOL JSM-7401F): The FESEM is JEOL's highest resolution SEM. Typical magnification in this SEM can be up to two hundred thousand times, however higher magnification, up to one million, can be obtained by a skilled operator. Two secondary electron detectors as well as a backscatter detector are installed. Also installed on this microscope is an energy dispersive X-ray spectrometer (EDS), to perform composition (elemental) analysis on most samples. It is capable of elemental mapping as well as line scans and automated point to point measurements.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org
AFM
AFM (Digital Instuments Dimension 3100): The AFM can scan on both hard- and soft-samples, in ambient air or in a fluid environment. Tapping mode uses a tip oscillating out of the plane of the scan, and intermittently taps the surface to examine the surface features. Contact mode uses a probe that drags along the surface at a constant force to determine the surface profile. Typical measurement resolution in the plane is 5-10 nm, whereas 1 nm resolutions are possible with a more specialized tip. Nanolithography (prescribed oxidation) may be performed, in addition to the manipulation of nano-scale specimens. Other means of surface scanning are also possible, including Scanning Tunneling Microscopy, which measures the height using current to maintain a constant tip-surface distance, Magnetic Force Microscopy, which measures the magnetic properties of the sample, and Lateral Force Microscopy which measures the frictional force on the tip as it is dragged across the surface.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org
CLSM (Confocal microscopy)
CLSM (Zeiss LSM 510): Confocal microscopy permits one to optically section a fluorescent sample with superior resolution by using a pinhole to reject light that originates outside of the chosen area. By collecting a series of such images through the depth of a sample, the user may assemble a highly accurate three-dimensional reconstruction of the entire sample. The Zeiss LSM 510 confocal microscope is equipped with AR, He/Ne and diode laser sources. The microscope also allows the users to perform FRET and FRAP techniques to track down biological functions.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org
Nanoindentors
Nano Indenters (MTS NANO Indenter XP and DCM): The Nano Indenter can load samples up to 500 mN force to the resolution of 50 nN, with a known displacement resolution of less than 0.01nm. This system is additionally equipped to make measurements using the Continuous Stiffness Method (CSM), allowing modulus and hardness profiles to be obtained throughout the entire depth of indentation. The dynamic contact module (DCM) indenter can load samples up to 10 mN force to the resolution of 10 nN, with a known displacement resolution of less than 0.001nm. A separate NANO Indenter XP is equipped with an isolating thermal chamber to allow testing at temperatures up to 100oC.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org
FIB (focused ion beam)
FIB (FEI Nova 600i): The FEI Nova 600i focused ion beam (FIB) is a dual beam system consisting of a field emission scanning electron microscope (SEM) and a scanning Gallium ion beam. This system can be used for a number of micrometer/nanometer scale machining tasks. These tasks range from transmission electron microscopy (TEM) sample preparation to micromachining and repairing micro electrical mechanical systems (MEMS). It will also allow working with natural samples, such as geological specimens. The system allows secondary electron imaging in both the SEM mode as well as the ion beam mode. Image magnification using the SEM can be greater than 500,000 times depending on the sample. The FIB system also includes: a digital patterning engine to fabricate complex 3D patterns, a multiple gas injector system for deposition as well as selective etching, and a computer controlled nanometer resolution manipulator for picking and placing individual segments to fabricate 3D nanostructures. An electron backscatter diffraction (EBSD) detector is also installed on this microscope allowing for crystallography on a submicron scale.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org
Nanomaterials characterization facility sample prep room
Sample prep: Our sample preparation room allows for specimens to be coated with charge dissipating carbon (arc) and/or gold (sputtered) surface layers prior to examination in SEM. Such coatings may have additional benefits, e.g. electrical or optical characterization. A Nikon LV 150 optical microscope may be used to obtain 3.3 MPix images. The reflective (metallurgical) microscope may be used to obtain brightfield, dark field, and polarizing contrast images. The high resolution microscope also benefits from its long working distance objectives. Specimens may also be ultrasonically cleaned prior to coating or other examination. A separate stereo microscope is also available.
Contact: Prof. Y.C. Lee, leeyc@colorado.edu
http://www.imintcenter.org